ETCIM: Error-Tolerant Digital CIM Processor with Redundancy-Free Hard Error Repair and Run-Time Soft Error Correction

Y. Wang, Z. He, C. Zhao, Z. Wu, M. Gao, H. Han, S. Wei, Y. Hu, F. Tu, S. Yin

January 2026

Abstract

Co-Corresponding Author, VLSI'24 Extension

Type

Journal article

Publication

IEEE Journal of Solid-State Circuits (JSSC)